Laser-Strahlenteiler HC BS R785
Produktinformationen "Laser-Strahlenteiler HC BS R785"
AOI 45°
Reflexion abs > 94% 780 - 790 nm
Reflexion (p-pol) abs > 90% 780 - 790 nm
Reflexion (s-pol) abs > 98% 780 - 790 nm
Reflection > 90% 350 - 780 nm (durchschnittlich)
Edge Wavelength 800 nm
Transmission > 93% 804.3 - 1200 nm (durchschnittl.)
Abmessung 25,2 x 35,6 x 1,1 mm
Reflexion abs > 94% 780 - 790 nm
Reflexion (p-pol) abs > 90% 780 - 790 nm
Reflexion (s-pol) abs > 98% 780 - 790 nm
Reflection > 90% 350 - 780 nm (durchschnittlich)
Edge Wavelength 800 nm
Transmission > 93% 804.3 - 1200 nm (durchschnittl.)
Abmessung 25,2 x 35,6 x 1,1 mm
Spezifikationen
| OEM-/Originalnummer: | Di02-R785-25x36 |
|---|---|
| Reflection Band 1: | Rabs > 94% 780 - 790 nm |
| Reflection Band 1 (p-pol): | Rabs > 90% 780 - 790 nm |
| Reflection Band 1 (s-pol): | Rabs > 98% 780 - 790 nm |
| Transmission Band 1: | Tavg > 93% 804.3 - 1200 nm |
| Laser Wavelengths 1: | 780 nm, 785 nm, 790nm |
| Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
| Cone Half-angle: | 0.5 degrees |
| Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Steepness: | Steep |
| Filter Effective Index: |
1.76 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Laser |
| Reflected Wavefront Error: | < 6λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 1.05 mm |
| Filter Thickness Tolerance (unm: | ± 0.05 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 1.05 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Langpass |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| Laserwellenlänge (nm): | 785 |
| Anwendung (bs): | Laser-Anwendung |
| CWL/EdgeWL/NotchWL (nm): | 785 |
| geeignet für: | Laser-Anwendungen |
| Substratdicke: | 1 mm |
| Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Scratch-Dig: | 60-40 |