Reflexion 632,8-647,1 nm >98% für s-pol.
Reflexion 632,8-647,1 nm >90% für p-pol.
Reflexion 632,8-647,1 nm >94%
Reflexion 350-632,8,8 nm >90% durchschnittlich
Transmission 658,8 - 1200,0 nm >93%
EBENHEIT: < 1 lambda P-V RWE @ 632.8 nm
Abmessung 25,2 x 35,6 x 1,05 mm
OEM-/Originalnummer: | Di03-R635-t1-25x36 |
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Reflection Band 1: | Rabs > 94% 632.8 - 647.1 nm |
Reflection Band 1 (p-pol): | Rabs > 90% 632.8 - 647.1 nm |
Reflection Band 1 (s-pol): | Rabs > 98% 632.8 - 647.1 nm |
Transmission Band 1: | Tavg > 93% 658.8 - 1200 nm |
Laser Wavelengths 1: | 632.8 nm, 635 +7/-3 nm, 647.1 nm |
Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
Cone Half-angle: | 0.5 degrees |
Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Filter Effective Index: |
1.76 Understanding `Effective Index of Refraction` neff |
Substrate type: | low-autofluorescence optical quality glass |
Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
Flatness / RWE Classification: | Super-resolution / TIRF |
Reflected Wavefront Error: | < 1λ P-V RWE @ 632.8 nm |
Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
Transverse Tolerance: | ± 0.1 mm |
Filter Thickness (1 mm, unmount: | 1.05 mm |
Filter Thickness Tolerance (1 m: | ± 0.05 mm |
Filter Thickness (3 mm, unmount: | 3.0 mm |
Filter Thickness Tolerance (3 m: | ± 0.1 mm |
Clear Aperture: | ≥ 80% (elliptical) |
Scratch-Dig: | 60-40 |
Substrate Thickness (1 mm, unmo: | 1.05 mm |
Substrate Thickness Tolerance (: | ± 0.05 mm |
Substrate Thickness (3 mm, unmo: | 3.0 mm |
Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
Abmessungen: | 25,2 x 35,6 mm |
Anzahl Bänder/Kanten/Notch: | 1 |
Art des Strahlenteilers: | Langpass |
Garantie: | 10 Jahre |
Kantensteilheit: | Standard für Fluoreszenz |
Laserwellenlänge (nm): | 635 |
geeignet für: | Laser-Anwendungen |
Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Scratch-Dig: | 60-40 |