Dual Line Strahlenteiler HC BS R488/561

598,00 €*

Lieferzeit ca. 2-5 Wochen

Artikel-Nr.: F58-486
Produktinformationen "Dual Line Strahlenteiler HC BS R488/561"
AOI 45°
Reflexion 471-491 und 559-568,2 nm >90% für p-pol.
Reflexion 471-491 und 559-568,2 nm >98% für s-pol.
Reflexion 471-491 und 559-568,2 nm >94%
Transmission 503,3-543 und 582,4-1200 nm >93%
Abmessung 25,2 x 35,6 x 1,1 mm
<1L/ P-V RWE @632,8 nm
Spezifikationen
OEM-/Originalnummer: Di03-R488/561-t1-25x36
Reflection Band 1: Rabs > 94% 471 - 491 nm
Reflection Band 1 (p-pol): Rabs > 90% 471 - 491 nm
Reflection Band 1 (s-pol): Rabs > 98% 471 - 491 nm
Edge Wavelength 1: 500 nm
Transmission Band 1: Tavg > 93% 503.3 - 543 nm
Reflection Band 2: Rabs > 94% 559 - 568.2 nm
Reflection Band 2 (p-pol): Rabs > 90% 559 - 568.2 nm
Reflection Band 2 (s-pol): Rabs > 98% 559 - 568.2 nm
Edge Wavelength 2: 575.5 nm
Transmission Band 2: Tavg > 93% 582.4 - 1200 nm
Laser Wavelengths 1: 473 +/- 2 nm, 488 +3/-2 nm
Laser Wavelengths 2: 559 +5/-0 nm, 561.4 nm, 568.2 nm
Angle of Incidence: 45 degrees with a shift of 0.35%/degree (40 - 50 degrees)
Cone Half-angle: 0.5 degrees
Optical Damage Rating: 1 J/cm² @ 532 nm (10 ns pulse width)
Steepness: Steep
Filter Effective Index: 2.07
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Reflected Wavefront Error (3 mm: < 0.2λ P-V RWE @ 632.8 nm
Flatness / RWE Classification: Super-resolution / TIRF
Reflected Wavefront Error: < 1λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (1 mm, unmount: 1.05 mm
Filter Thickness Tolerance (1 m: ± 0.05 mm
Filter Thickness (3 mm, unmount: 3.0 mm
Filter Thickness Tolerance (3 m: ± 0.1 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Substrate Thickness (3 mm, unmo: 3.0 mm
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Anzahl Bänder/Kanten/Notch: 2
Art des Strahlenteilers: Multiband
Garantie: 10 Jahre
Kantensteilheit: Standard für Fluoreszenz
Laserwellenlänge (nm): 488
geeignet für: Laser-Anwendungen
Substratdicke: 1 mm
Damage Threshold: 1 J/cm² @ 532 nm (10 ns pulse width)
Scratch-Dig: 60-40