Strahlenteiler HC BS 499



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  • F38-499
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Spezifikationen

Order-No.: FF499-Di01-25x36
Reflection Band 1: Ravg > 90% 470 - 490 nm
Edge Wavelength 1: 499 nm
Transmission Band 1: Tavg > 90% 508 - 675 nm
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness: Standard
Filter Effective Index: 2.03
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Standard Epi-fluorescence
Reflected Wavefront Error: >> 6λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unmounted): ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Anzahl Bänder/Kanten/Notch: 1
Garantie: 10 Jahre
Anwendung (bs): Epifluoreszenz
Kantensteilheit: Standard für Fluoreszenz
Substratdicke: 1 mm
Scratch-Dig: 60-40
Art des Strahlenteilers: Langpass
geeignet für: Epi-Fluoreszenz
Abmessungen: 25,2 x 35,6 mm
Damage Threshold: no signs of degradation acc. to testing
CWL/EdgeWL/NotchWL (nm): 499
Ebenheit: nicht definiert
Hersteller (optische Filter): Semrock