Strahlenteiler HC BS 482



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  • F38-482
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AOI 45° 25,2 mm x 35,6 mm x 1,1 mm mehr
Produktinformationen "Strahlenteiler HC BS 482"
AOI 45°
25,2 mm x 35,6 mm x 1,1 mm
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Spezifikationen

OrderNo.: FF482-Di01-25x36
Reflection Band 1: Ravg > 90% 415 - 470 nm
Transmission Band 1: Tavg > 90% 490 - 720 nm
Edge Wavelength 1: 482 nm
Angle of Incidence (AOI): 45 ± 1.5 degrees
Cone Half-angle (CHA): 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Filter Effective Index: 1.88
Understanding ‘Effective Index of Refraction’ neff
Flatness / RWE Classification:
Standard Epi-fluorescence"
Reflected Wavefront Error: >> 6 lambda P-V RWE @ 632.8 nm
Steepness: Standard
Transverse Dimensions (LxW): 25.2 mm x 35.6 mm
Transverse Tolerance (mounted): ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unmounted): ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate Thickness (unmounted): 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Substrate Type: low-autofluorescence optical quality glass
Ebenheit: nicht definiert
Scratch-Dig: 60-40
Kantensteilheit: Standard für Fluoreszenz
Anzahl Bänder/Kanten/Notch: 1
geeignet für: Epi-Fluoreszenz
Damage Threshold: no signs of degradation acc. to testing
Art des Strahlenteilers: Langpass
Hersteller: Semrock
Substratdicke: 1nm
CWL/EdgeWL/NotchWL (nm): 482 nm