Strahlenteiler HC 458
306,00 € *
Inhalt: 1 Stück
* zzgl. MwSt., zzgl. Versandkosten
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Lieferzeit ca. 2–5 Wochen
- Artikel-Nr.: F38-458
AOI 45° Abmessung 25,2 mm x 35,6 mm x 1,1 mm mehr
Produktinformationen "Strahlenteiler HC 458"
AOI 45°
Abmessung 25,2 mm x 35,6 mm x 1,1 mm
Abmessung 25,2 mm x 35,6 mm x 1,1 mm
Weiterführende Links zu "Strahlenteiler HC 458"
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Spezifikationen
| OEM-/Originalnummer: | FF458-Di02-25x36 |
| Reflection Band 1: | Ravg > 98% 350 - 450 nm |
| Reflection Band 2: | Ravg > 98% 426 - 450 nm |
| Edge Wavelength 1: | 458 nm |
| Transmission Band 1: | Tavg > 93% 467 - 950 nm |
| Transmission Band 2: | Tavg > 93% 467 - 600 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness: | Standard |
| Filter Effective Index: | 1.80 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Standard Epi-fluorescence |
| Reflected Wavefront Error: | >> 6λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 1.05 mm |
| Filter Thickness Tolerance (unm: | ± 0.05 mm |
| Clear Aperture: | ≥ 80% |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 1.05 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| Scratch-Dig: | 60-40 |
| Substratdicke: | 1,05 mm |
| Art des Strahlenteilers: | Langpass |
| geeignet für: | Epi-Fluoreszenz |
| CWL/EdgeWL/NotchWL (nm): | 458 |
| Abmessungen: | 25,2 x 35,6 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| Ebenheit: | nicht definiert |
| Hersteller (optische Filter): | IDEX / Semrock |