Kurzpass-Strahlenteiler HC BS 625 SP



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  • F38-625
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AOI 45° Transmission 400 - 603 nm ≥ 90% Reflexion 635 - 850 nm ≥ 95% Abmessung... mehr
Produktinformationen "Kurzpass-Strahlenteiler HC BS 625 SP"
AOI 45°
Transmission 400 - 603 nm ≥ 90%
Reflexion 635 - 850 nm ≥ 95%
Abmessung 25,2 x 35,6 x 1,1 mm
Weiterführende Links zu "Kurzpass-Strahlenteiler HC BS 625 SP"
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Spezifikationen

Order-No.: FF625-SDi01-25x36
Reflection Band 1: Ravg > 98% 635 - 850 nm
Edge Wavelength 1: 625 nm
Transmission Band 1: Tavg > 90% 400 - 620 nm
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness: Standard
Filter Effective Index: 2.32
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Standard Epi-fluorescence
Reflected Wavefront Error: >> 6λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unmounted): ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Anzahl Bänder/Kanten/Notch: 1
Garantie: 10 Jahre
Kantensteilheit: Standard für Fluoreszenz
Scratch-Dig: 60-40
geeignet für: Epi-Fluoreszenz
Art des Strahlenteilers: Kurzpass
Abmessungen: 25,2 x 35,6 mm
Damage Threshold: no signs of degradation acc. to testing
CWL/EdgeWL/NotchWL (nm): 625
Ebenheit: >> 6 lambda P/V RWE
Hersteller (optische Filter): Semrock