Kurzpass-Strahlenteiler HC 556 SP
379,00 € *
Inhalt: 1 Stück
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- Artikel-Nr.: F38-556
AOI 45° Transmission 480 – 552 nm ≥ 93% Reflexion 561 – 950 ≥ 97% Abmessung 25,2... mehr
Produktinformationen "Kurzpass-Strahlenteiler HC 556 SP"
AOI 45°
Transmission 480 – 552 nm ≥ 93%
Reflexion 561 – 950 ≥ 97%
Abmessung 25,2 x 35,6 x 1,1 mm
Transmission 480 – 552 nm ≥ 93%
Reflexion 561 – 950 ≥ 97%
Abmessung 25,2 x 35,6 x 1,1 mm
Weiterführende Links zu "Kurzpass-Strahlenteiler HC 556 SP"
Technische DetailsMehr anzeigen
Spezifikationen
| OEM-/Originalnummer: | FF556-SDi01-25x36 |
| Reflection Band 1: | Ravg > 97% 561 - 950 nm |
| Edge Wavelength 1: | 556 nm |
| Transmission Band 1: | Tavg > 93% 480 - 552 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness: | Standard |
| Filter Effective Index: | 1.84 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Standard Epi-fluorescence |
| Reflected Wavefront Error: | >> 6λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 1.05 mm |
| Filter Thickness Tolerance (unm: | ± 0.05 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 1.05 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| Scratch-Dig: | 60-40 |
| geeignet für: | Epi-Fluoreszenz |
| Art des Strahlenteilers: | Kurzpass |
| Abmessungen: | 25,2 x 35,6 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| CWL/EdgeWL/NotchWL (nm): | 556 |
| Ebenheit: | >> 6 lambda P/V RWE |
| Hersteller (optische Filter): | IDEX / Semrock |