Strahlenteiler HC 699 imaging flat
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Inhalt: 1 Stück
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- Artikel-Nr.: F38-668
AOI 45° Reflexion 350-686 nm > 95% Transmission 712 - 1200 nm >93% durchschnittlich EBENHEIT:... mehr
Produktinformationen "Strahlenteiler HC 699 imaging flat"
AOI 45°
Reflexion 350-686 nm > 95%
Transmission 712 - 1200 nm >93% durchschnittlich
EBENHEIT: < 2 lambda P-V RWE @ 632.8 nm
Abmessung 25,2 mm x 35,6 mm x 1,05 mm
Reflexion 350-686 nm > 95%
Transmission 712 - 1200 nm >93% durchschnittlich
EBENHEIT: < 2 lambda P-V RWE @ 632.8 nm
Abmessung 25,2 mm x 35,6 mm x 1,05 mm
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Technische DetailsMehr anzeigen
Spezifikationen
| OEM-/Originalnummer: | FF699-FDi01-t1-25x36 |
| Reflection Band 1: | Rabs > 94% 439 - 457.9 nm |
| Reflection Band 1 (p-pol): | Rabs > 90% 439 - 457.9 nm |
| Reflection Band 1 (s-pol): | Rabs > 98% 439 - 457.9 nm |
| Transmission Band 1: | Tavg > 93% 466.1 - 1200 nm |
| Edge Wavelength 1: | 699 nm |
| Laser Wavelengths 1: | 440 +3/-1 nm, 442.0 nm & 457.9 nm |
| Common Fluorophore Pair to Spli: | iRFP670/iRFP720 or AlexaFluor647/AlexaFluor700 |
| Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
| Cone Half-angle: | 0.5 degrees |
| Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Steepness: | Standard |
| Filter Effective Index: | 2.18 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
| Flatness / RWE Classification: | Super-resolution / TIRF |
| Reflected Wavefront Error: | < 1λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (1 mm, unmount: | 1.05 mm |
| Filter Thickness Tolerance (1 m: | ± 0.05 mm |
| Filter Thickness (3 mm, unmount: | 3.0 mm |
| Filter Thickness Tolerance (3 m: | ± 0.1 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (1 mm, unmo: | 1.05 mm |
| Substrate Thickness Tolerance (: | ± 0.05 mm |
| Substrate Thickness (3 mm, unmo: | 3.0 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Garantie: | 10 Jahre |
| Anwendung (bs): | Epifluoreszenz |
| Kantensteilheit: | Standard für Fluoreszenz |
| Substratdicke: | 1,05 mm |
| Art des Strahlenteilers: | Langpass |
| Abmessungen: | 25,2 x 35,6 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| geeignet für: | Image-Splitting |
| Scratch-Dig: | 40-20 |
| CWL/EdgeWL/NotchWL (nm): | 699 |
| Ebenheit: | <=2 lambda P/V RWE |
| Hersteller (optische Filter): | IDEX / Semrock |