Strahlenteiler HC BS 662 imaging

390,00 €*

Lieferzeit ca. 2-5 Wochen

Artikel-Nr.: F38-662
Produktinformationen "Strahlenteiler HC BS 662 imaging"
AOI 45°
Reflexion 350-650 nm >95%
Transmission 674-950 nm >93%
Abmessung 25,2 x 35,6 x 1,1 mm
Spezifikationen
OEM-/Originalnummer: FF662-FDi01-25x36
Edge Wavelength 1: 662 nm
Transmission Band 1: Tavg > 93% 673.7 - 950 nm
Common Fluorophore Pair to Spli: TxRed/Cy5
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness: Standard
Filter Effective Index: 1.74
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Image-splitting
Reflected Wavefront Error: < 2λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unm: ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Abmessungen: 25,2 x 35,6 mm
Anzahl Bänder/Kanten/Notch: 1
Art des Strahlenteilers: Langpass
Garantie: 10 Jahre
Kantensteilheit: Standard für Fluoreszenz
Anwendung (bs): Laser-Anwendung
CWL/EdgeWL/NotchWL (nm): 662
geeignet für: Image-Splitting
Substratdicke: 1 mm
Damage Threshold: no signs of degradation acc. to testing
Scratch-Dig: 60-40