Strahlenteiler HC BS 699 imaging flat



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  • F38-668
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AOI 45° Reflexion 350-686 nm > 95% Transmission 712 - 1200 nm >93% durchschnittlich EBENHEIT:... mehr
Produktinformationen "Strahlenteiler HC BS 699 imaging flat"
AOI 45°
Reflexion 350-686 nm > 95%
Transmission 712 - 1200 nm >93% durchschnittlich
EBENHEIT: < 2="" lambda="" p-v="" rwe="" @="" 632.8="">
Abmessung 25,2 mm x 35,6 mm x 1,05 mm
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Spezifikationen

Order-No.: FF699-FDi01-t1-25x36
Reflection Band 1: Rabs > 94% 439 - 457.9 nm
Reflection Band 1 (p-pol): Rabs > 90% 439 - 457.9 nm
Reflection Band 1 (s-pol): Rabs > 98% 439 - 457.9 nm
Transmission Band 1: Tavg > 93% 466.1 - 1200 nm
Edge Wavelength 1: 699 nm
Laser Wavelengths 1: 440 +3/-1 nm, 442.0 nm & 457.9 nm
Common Fluorophore Pair to Split: iRFP670/iRFP720 or AlexaFluor647/AlexaFluor700
Angle of Incidence: 45 degrees with a shift of 0.35%/degree (40 - 50 degrees)
Cone Half-angle: 0.5 degrees
Optical Damage Rating: 1 J/cm² @ 532 nm (10 ns pulse width)
Steepness: Standard
Filter Effective Index: 2.18
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Reflected Wavefront Error (3 mm thickness): < 0.2λ P-V RWE @ 632.8 nm
Flatness / RWE Classification: Super-resolution / TIRF
Reflected Wavefront Error: < 1λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (1 mm, unmounted): 1.05 mm
Filter Thickness Tolerance (1 mm, unmounted): ± 0.05 mm
Filter Thickness (3 mm, unmounted): 3.0 mm
Filter Thickness Tolerance (3 mm, unmounted): ± 0.1 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate Thickness (1 mm, unmounted): 1.05 mm
Substrate Thickness Tolerance (1 mm, unmounted): ± 0.05 mm
Substrate Thickness (3 mm, unmounted): 3.0 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Anzahl Bänder/Kanten/Notch: 1
Garantie: 10 Jahre
Anwendung (bs): Epifluoreszenz
Kantensteilheit: Standard für Fluoreszenz
Hersteller: Semrock
Substratdicke: 1,05 mm
Art des Strahlenteilers: Langpass
Abmessungen: 25,2 x 35,6 mm
Damage Threshold: no signs of degradation acc. to testing
geeignet für: Image-Splitting
Scratch-Dig: 40-20
CWL/EdgeWL/NotchWL (nm): 699
Ebenheit: <=2 lambda P/V RWE