Strahlenteiler HC BS 765 imaging
Produktinformationen "Strahlenteiler HC BS 765 imaging"
AOI 45°
Reflexion 450 - 750 nm
Transmission 780 - 950 nm
25,2 x 35,6 x 2 mm image flat
Reflexion 450 - 750 nm
Transmission 780 - 950 nm
25,2 x 35,6 x 2 mm image flat
Spezifikationen
| OEM-/Originalnummer: | FF765-Di01-25x36x2.0 |
|---|---|
| Edge Wavelength 1: | 765 nm |
| Transmission Band 1: | Tavg > 93% 780 - 950 nm |
| Angle of Incidence: | 45 ± 1.5 degrees |
| Cone Half-angle: | 2 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness: | Standard |
| Filter Effective Index: |
1.86 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Flatness / RWE Classification: | Image-splitting |
| Reflected Wavefront Error: | < 2λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (unmounted): | 2.0 mm |
| Filter Thickness Tolerance (unm: | ± 0.1 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 2.0 mm |
| Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Abmessungen: | 25,2 x 35,6 mm |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Art des Strahlenteilers: | Langpass |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| CWL/EdgeWL/NotchWL (nm): | 765 |
| geeignet für: | Image-Splitting |
| Substratdicke: | 2,0 mm |
| Damage Threshold: | no signs of degradation acc. to testing |
| Scratch-Dig: | 60-40 |