Strahlenteiler HC BS 662 imaging



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  • F38-662
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AOI 45° Reflexion 350-650 nm >95% Transmission 674-950 nm >93% Abmessung 25,2 x 35,6 x 1,1 mm mehr
Produktinformationen "Strahlenteiler HC BS 662 imaging"
AOI 45°
Reflexion 350-650 nm >95%
Transmission 674-950 nm >93%
Abmessung 25,2 x 35,6 x 1,1 mm
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Spezifikationen

OrderNo.: FF662-FDi01-25x36
Substrate Type: low-autofluorescence optical quality glass
Scratch-Dig: 60-40
ravg-and-passband-range 1: Ravg > 95% 350 - 650 nm
edgewl 1: 662 nm
Transmission Band 1: Tavg > 93% 673.7 - 950 nm
Angle of Incidence (AOI): 45 ± 1.5 degrees
Cone Half-angle (CHA): 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Flatness:
Image-splitting"
Steepness: Standard
Transverse Dimensions (LxW): 25.2 mm x 35.6 mm
Transverse Tolerance (mounted): ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unmounted): ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Filter Effective Index: 1.74
Understanding ‘Effective Index of Refraction’ neff
Fluorophore-pair-to-split: TxRed/Cy5
Scratch-Dig: 60-40
Kantensteilheit: Standard für Fluoreszenz
Anzahl Bänder/Kanten/Notch: 1
Damage Threshold: no signs of degradation acc. to testing
geeignet für: Image-Splitting
Art des Strahlenteilers: Langpass
Hersteller: Semrock
CWL/EdgeWL/NotchWL (nm): 662 nm
Ebenheit: <=2 lambda P/V