432/515/595/730 HC Quadband Filter
Produktinformationen "432/515/595/730 HC Quadband Filter"
AOI 0°
Durchmesser 25 mm x 3,5 nmm
Durchmesser 25 mm x 3,5 nmm
Spezifikationen
| OEM-/Originalnummer: | FF01-432/515/595/730-25 |
|---|---|
| Transmission Band 1: | Tavg > 93% 414 - 450 nm |
| Center Wavelength 1: | 432 nm |
| Guaranteed Minimum Bandwidth 1: | 36 nm |
| FWHM Bandwidth 1 (nominal): | 39.7 nm |
| Blocking Band 1: | ODavg > 4 200 - 381 nm |
| Transmission Band 2: | Tavg > 93% 499.5 - 530 nm |
| Center Wavelength 2: | 514.8 nm |
| Guaranteed Minimum Bandwidth 2: | 30.5 nm |
| FWHM Bandwidth 2 (nominal): | 35.5 nm |
| Blocking Band 2: |
ODavg > 8 381 - 404 nm Design specification measurements are noise-floor limited |
| Transmission Band 3: | Tavg > 93% 580 - 611 nm |
| Center Wavelength 3: | 595.5 nm |
| Guaranteed Minimum Bandwidth 3: | 31 nm |
| FWHM Bandwidth 3 (nominal): | 36.2 nm |
| Blocking Band 3: | OD > 3.5 409 nm |
| Transmission Band 4: | Tavg > 93% 661 - 800 nm |
| Center Wavelength 4: | 730.5 nm |
| Guaranteed Minimum Bandwidth 4: | 139 nm |
| FWHM Bandwidth 4 (nominal): | 147.2 nm |
| Blocking Band 4: | OD > 3.5 455.5 nm |
| Blocking Band 5: |
ODavg > 8 461 - 487.5 nm Design specification measurements are noise-floor limited |
| Blocking Band 6: | OD > 3.5 493.5 nm |
| Blocking Band 7: | OD > 3.5 536.5 nm |
| Blocking Band 8: |
ODavg > 8 543 - 566 nm Design specification measurements are noise-floor limited |
| Blocking Band 9: | OD > 3.5 573 nm |
| Blocking Band 10: | OD > 3.5 618.5 nm |
| Blocking Band 11: |
ODavg > 8 626 - 644 nm Design specification measurements are noise-floor limited |
| Blocking Band 12: | OD > 3.5 651.8 nm |
| Blocking Band 13: | ODavg > 5 815 - 900 nm |
| Angle of Incidence: | 0 ± 5 degrees |
| Cone Half-angle: | 7 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Filter Effective Index: |
1.90 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Transverse Dimensions (Diameter: | 25 mm |
| Transverse Tolerance: | + 0.0 / - 0.1 mm |
| Filter Thickness (mounted): | 3.5 mm |
| Filter Thickness Tolerance (mou: | ± 0.1 mm |
| Clear Aperture: | ≥ 22 mm |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 2.0 mm |
| Orientation: | Arrow on ring indicates preferred direction of propagation of light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Abmessungen: | D = 25 mm |
| Anzahl Bänder/Kanten/Notch: | 4 |
| Art des Filters: | Multiband |
| Anwendung (Filter): | Standard/Fluoreszenz |
| CWL/EdgeWL/NotchWL (nm): | 432, 515, 595, 730 |
| Substratdicke: | 2,0 mm |
| Scratch-Dig: | 60-40 |
| freie Apertur: | >= 22 mm, >= 22 mm |