494/34 BrightLine HC
373,00 € *
Inhalt: 1 Stück
* zzgl. MwSt., zzgl. Versandkosten
* Sparen Sie 5% auf den Preis bei Online-Bestellung!
verfügbar, Lieferzeit ca. 1–3 Werktage
- Artikel-Nr.: F39-493
AOI 0° Durchmesser 25 mm Dicke 3,5 mm mehr
Produktinformationen "494/34 BrightLine HC"
AOI 0°
Durchmesser 25 mm
Dicke 3,5 mm
Durchmesser 25 mm
Dicke 3,5 mm
Weiterführende Links zu "494/34 BrightLine HC"
Technische DetailsMehr anzeigen
Spezifikationen
| OEM-/Originalnummer: | FF01-494/34-25 |
| Transmission Band 1: | Tavg > 93% 477 - 511 nm |
| Center Wavelength 1: | 494nm |
| Guaranteed Minimum Bandwidth 1: | 34 nm |
| FWHM Bandwidth 1 (nominal): | 39.3 nm |
| Blocking Band 1: | ODavg > 4 200 - 421 nm |
| Blocking Band 2: | ODavg > 10 421 - 462.5 nm Design specification measurements are noise-floor limited |
| Blocking Band 3: | OD > 3.5 @ 469.8 nm |
| Blocking Band 4: | OD > 3.5 @ 520 nm |
| Blocking Band 5: | ODavg > 6 522 - 600 nm |
| Blocking Band 6: | ODavg > 5 600 - 700 nm |
| Blocking Band 7: | ODavg >= 5 700 - 925 nm |
| Blocking Band 8: | ODavg > Z xxx - yyy nm |
| Angle of Incidence: | 0 ± 5 degrees |
| Cone Half-angle: | 7 degrees |
| Optical Damage Rating: | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Filter Effective Index: | 2.00 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Transverse Dimensions (Diameter: | 25 mm |
| Transverse Tolerance: | + 0.0 / - 0.1 mm |
| Filter Thickness (mounted): | 3.5 mm |
| Filter Thickness Tolerance (mou: | ± 0.1 mm |
| Clear Aperture: | ≥ 22 mm |
| Scratch-Dig: | 60-40 |
| Substrate thickness: | 2.0 mm |
| Substrate thickness tolerance: | ± 0.1 mm |
| Orientation: | Arrow on ring indicates preferred direction of propagation of light |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Anzahl Bänder/Kanten/Notch: | 1 |
| Abmessungen: | D = 25 mm |
| Scratch-Dig: | 60-40 |
| Anwendung (Filter): | Standard/Fluoreszenz |
| Art des Filters: | Bandpass |
| Substratdicke: | 2,0 mm |
| freie Apertur: | >= 22 mm |
| Bandbreite (nm): | 34 |
| CWL/EdgeWL/NotchWL (nm): | 494 |
| Hersteller (optische Filter): | IDEX / Semrock |