QuadLine Laser-Strahlenteiler R405/488/532/635
Produktinformationen "QuadLine Laser-Strahlenteiler R405/488/532/635"
AOI 45°
Ebenheit ≤ 1 lambda P-V RWE
Abmessung 25,2 x35,6 x 1,1 mm
Ebenheit ≤ 1 lambda P-V RWE
Abmessung 25,2 x35,6 x 1,1 mm
Spezifikationen
| OEM-/Originalnummer: | Di03-R405/488/532/635-t1-25x36 |
|---|---|
| Reflection Band 1: | Rabs > 94% 370 - 410 nm |
| Reflection Band 1 (p-pol): | Rabs > 90% 370 - 410 nm |
| Reflection Band 1 (s-pol): | Rabs > 98% 370 - 410 nm |
| Edge Wavelength 1: | 418.8 nm |
| Transmission Band 1: | Tavg > 93% 426 - 462 nm |
| Reflection Band 2: | Rabs > 94% 473 - 491 nm |
| Reflection Band 2 (p-pol): | Rabs > 90% 473 - 491 nm |
| Reflection Band 2 (s-pol): | Rabs > 98% 473 - 491 nm |
| Edge Wavelength 2: | 497.6 nm |
| Transmission Band 2: | Tavg > 93% 502.5 - 518.5 nm |
| Reflection Band 3: | Rabs > 94% 530.5 - 533.5 nm |
| Reflection Band 3 (p-pol): | Rabs > 90% 530.5 - 533.5 nm |
| Reflection Band 3 (s-pol): | Rabs > 98% 530.5 - 533.5 nm |
| Edge Wavelength 3: | 541.9 nm |
| Transmission Band 3: | Tavg > 93% 550 - 613 nm |
| Reflection Band 4: | Rabs > 94% 632.8 - 647.1 nm |
| Reflection Band 4 (p-pol): | Rabs > 90% 632.8 - 647.1 nm |
| Reflection Band 4 (s-pol): | Rabs > 98% 632.8 - 647.1 nm |
| Edge Wavelength 4: | 659.1 nm |
| Transmission Band 4: | Tavg > 93% 663 - 1200 nm |
| Laser Wavelengths 1: | 375 +/- 3 nm, 405 +/- 5 nm |
| Laser Wavelengths 2: | 473 +2/-0 nm, 488 +3/-2 nm |
| Laser Wavelengths 3: | 532 nm |
| Laser Wavelengths 4: | 632.8 nm, 635 +7/-0 nm, 647.1 nm |
| Reflection Band 5: | Ravg > 90% 350 - 370 nm |
| Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
| Cone Half-angle: | 0.5 degrees |
| Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Filter Effective Index: |
2.06 Understanding `Effective Index of Refraction` neff |
| Substrate type: | low-autofluorescence optical quality glass |
| Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
| Flatness / RWE Classification: | Super-resolution / TIRF |
| Reflected Wavefront Error: | < 1λ P-V RWE @ 632.8 nm |
| Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
| Transverse Tolerance: | ± 0.1 mm |
| Filter Thickness (1 mm, unmount: | 1.05 mm |
| Filter Thickness Tolerance (1 m: | ± 0.05 mm |
| Filter Thickness (3 mm, unmount: | 3.0 mm |
| Filter Thickness Tolerance (3 m: | ± 0.1 mm |
| Clear Aperture: | ≥ 80% (elliptical) |
| Scratch-Dig: | 60-40 |
| Substrate Thickness (1 mm, unmo: | 1.05 mm |
| Substrate Thickness Tolerance (: | ± 0.05 mm |
| Substrate Thickness (3 mm, unmo: | 3.0 mm |
| Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
| Garantie: | 10 Jahre |
| Kantensteilheit: | Standard für Fluoreszenz |
| geeignet für: | Laser-Anwendungen |
| Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Scratch-Dig: | 60-40 |