Beamsplitter HC 580 imaging flat

€617.00*

delivery time 2-5 weeks

Article-Nr.: F38-580_T3
Product information "Beamsplitter HC 580 imaging flat"
AOI 45°
Reflection 350-570 nm >95%
Transmission 591-950 nm >93%
Dimension 25,2 x 35,6 x 3 mm
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Specifications
OEM/Original number: FF580-FDi02-t3-25x36
Reflection Band 1: Ravg > 95% 350 - 570 nm
Edge Wavelength 1: 580 nm
Transmission Band 1: Tavg > 93% 590.8 - 1200 nm
Common Fluorophore Pair to Spli: GFP/mCherry or FITC/TxRed
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness: Standard
Filter Effective Index: 1.84
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Substrate type: low-autofluorescence optical quality glass
Reflected Wavefront Error (3 mm: < 0.2λ P-V RWE @ 632.8 nm
Flatness / RWE Classification: Image-splitting
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (3 mm, unmount: 3.0 mm
Filter Thickness Tolerance (3 m: ± 0.1 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate Thickness (3 mm, unmo: 3.0 mm
Orientation: Reflective surface marked with laser dot - Orient in direction of incoming light
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Application (bs): Super-resolution
CWL/EdgeWL/NotchWL (nm): 580
Number of Bands/Edges/Notches: 1
Size: 25,2 x 35,6 mm
Steepness: Standard für Fluoreszenz
Substrate Thickness: 3,0 mm
Type (beamsplitter): Langpass
Warranty: 10 Jahre
suitable for: Image-Splitting
Scratch-Dig: 60-40