Reflection 439-457,9 nm >98% for s-pol.
Reflection 439-457,9 nm >90% for p-pol.
Reflection 439-457,9 nm >94%
Reflection 350-439 nm >90% avg.
Transmission 466,1 – 1200,0 nm >93% avg.
FLATNESS: < 0.2="" lambda="" p-v="" rwe="" @="" 632.8="">
Dimension 25,2 x 35,6 x 3,0 mm
OEM/Original number: | Di03-R442-t3-25x36 |
---|---|
Reflection Band 1: | Rabs > 94% 439 - 457.9 nm |
Reflection Band 1 (p-pol): | Rabs > 90% 439 - 457.9 nm |
Reflection Band 1 (s-pol): | Rabs > 98% 439 - 457.9 nm |
Transmission Band 1: | Tavg > 93% 466.1 - 1200 nm |
Laser Wavelengths 1: | 440 +3/-1 nm, 442.0 nm & 457.9 nm |
Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
Cone Half-angle: | 0.5 degrees |
Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Filter Effective Index: |
2.18 Understanding `Effective Index of Refraction` neff |
Substrate type: | low-autofluorescence optical quality glass |
Reflected Wavefront Error (3 mm: | < 0.2λ P-V RWE @ 632.8 nm |
Flatness / RWE Classification: | Super-resolution / TIRF |
Reflected Wavefront Error: | < 1λ P-V RWE @ 632.8 nm |
Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
Transverse Tolerance: | ± 0.1 mm |
Filter Thickness (1 mm, unmount: | 1.05 mm |
Filter Thickness Tolerance (1 m: | ± 0.05 mm |
Filter Thickness (3 mm, unmount: | 3.0 mm |
Filter Thickness Tolerance (3 m: | ± 0.1 mm |
Clear Aperture: | ≥ 80% (elliptical) |
Scratch-Dig: | 60-40 |
Substrate Thickness (1 mm, unmo: | 1.05 mm |
Substrate Thickness Tolerance (: | ± 0.05 mm |
Substrate Thickness (3 mm, unmo: | 3.0 mm |
Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
Application (bs): | Super-resolution |
Number of Bands/Edges/Notches: | 1 |
Size: | 25,2 x 35,6 mm |
Steepness: | Standard für Fluoreszenz |
Substrate Thickness: | 3,0 mm |
Type (beamsplitter): | Langpass |
Warranty: | 10 Jahre |
suitable for: | Laser-Anwendungen |
Laser Wavelength (nm): | 442 |
Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Scratch-Dig: | 60-40 |