Reflection 780-830 nm > 94% (absolute)
Reflection (p-pol) 780-830 nm > 90% (absolute)
Reflection (s-pol) 780-830 nm > 98% (absolute)
Reflection 350-830 nm >90% (av.)
Transmission 845 - 1600 nm >93%
for Laser wavelengths 785 nm +/- 5 nm, 808 nm, 810 nm, 830 nm
size 25,2 x 35,6 x 1,1 mm
OEM/Original number: | Di02-R830-25x36 |
---|---|
Reflection Band 1: | Rabs > 94% 780 - 830 nm |
Reflection Band 1 (p-pol): | Rabs > 90% 780 - 830 nm |
Reflection Band 1 (s-pol): | Rabs > 98% 780 - 830 nm |
Transmission Band 1: | Tavg > 93% 845 - 1600 nm |
Laser Wavelengths 1: | 785 ± 5 nm, 808 nm, 810 nm, 830 nm |
Angle of Incidence: | 45 degrees with a shift of 0.35%/degree (40 - 50 degrees) |
Cone Half-angle: | 0.5 degrees |
Optical Damage Rating: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Steepness: | Steep |
Filter Effective Index: |
2.0 Understanding `Effective Index of Refraction` neff |
Substrate type: | low-autofluorescence optical quality glass |
Flatness / RWE Classification: | Laser |
Reflected Wavefront Error: | < 6λ P-V RWE @ 632.8 nm |
Transverse Dimensions (L x W): | 25.2 mm x 35.6 mm |
Transverse Tolerance: | ± 0.1 mm |
Filter Thickness (unmounted): | 1.05 mm |
Filter Thickness Tolerance (unm: | ± 0.05 mm |
Clear Aperture: | ≥ 80% (elliptical) |
Scratch-Dig: | 60-40 |
Substrate thickness: | 1.05 mm |
Orientation: | Reflective surface marked with part number - Orient in direction of incoming light |
Other physical specs: | Standard Specifications of Our Filters and Beam Splitters |
CWL/EdgeWL/NotchWL (nm): | 830 |
Number of Bands/Edges/Notches: | 1 |
Size: | 25,2 x 35,6 mm |
Steepness: | Standard für Fluoreszenz |
Substrate Thickness: | 1 mm |
Type (beamsplitter): | Langpass |
Warranty: | 10 Jahre |
suitable for: | Laser-Anwendungen |
Laser Wavelength (nm): | 785, 808, 810, 830 |
Damage Threshold: | 1 J/cm² @ 532 nm (10 ns pulse width) |
Scratch-Dig: | 60-40 |