Laser Beamsplitter HC R785

€598.00*

delivery time 2-5 weeks

Article-Nr.: F38-785
Product information "Laser Beamsplitter HC R785"
AOI 45°
Reflection abs > 94% 780 – 790 nm
Reflection (p-pol) abs > 90% 780 – 790 nm
Reflection (s-pol) abs > 98% 780 – 790 nm
Reflection > 90% 350 – 780 nm (av.)
Edge Wavelength 800 nm
Transmission > 93% 804.3 – 1200 nm (av.)
Dimension 25,2 x 35,6 x 1,1 mm
Specifications
OEM/Original number: Di02-R785-25x36
Reflection Band 1: Rabs > 94% 780 - 790 nm
Reflection Band 1 (p-pol): Rabs > 90% 780 - 790 nm
Reflection Band 1 (s-pol): Rabs > 98% 780 - 790 nm
Transmission Band 1: Tavg > 93% 804.3 - 1200 nm
Laser Wavelengths 1: 780 nm, 785 nm, 790nm
Angle of Incidence: 45 degrees with a shift of 0.35%/degree (40 - 50 degrees)
Cone Half-angle: 0.5 degrees
Optical Damage Rating: 1 J/cm² @ 532 nm (10 ns pulse width)
Steepness: Steep
Filter Effective Index: 1.76
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Laser
Reflected Wavefront Error: < 6λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unm: ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Application (bs): Laser-Anwendung
CWL/EdgeWL/NotchWL (nm): 785
Number of Bands/Edges/Notches: 1
Size: 25,2 x 35,6 mm
Steepness: Standard für Fluoreszenz
Substrate Thickness: 1 mm
Type (beamsplitter): Langpass
Warranty: 10 Jahre
suitable for: Laser-Anwendungen
Laser Wavelength (nm): 785
Damage Threshold: 1 J/cm² @ 532 nm (10 ns pulse width)
Scratch-Dig: 60-40