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Beamsplitter HC 580 imaging

€390.00 *
Content: 1 Pieces

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Delivery time appr. 6–10 weeks

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  • F38-580
Wellenlänge nm
AOI 45° Reflection 350-570 nm >95% Transmission 591-950 nm >93% Dimension 25,2 x 35,6 x 1,1 mm more
Product information "Beamsplitter HC 580 imaging"
AOI 45°
Reflection 350-570 nm >95%
Transmission 591-950 nm >93%
Dimension 25,2 x 35,6 x 1,1 mm
Related links to "Beamsplitter HC 580 imaging"
Technical DataMehr anzeigen


OEM-/Manufacturer Number: FF580-FDi01-25x36
Edge Wavelength 1: 580 nm
Transmission Band 1: Tavg > 93% 590.8 - 950 nm
Common Fluorophore Pair to Spli: GFP/mCherry or FITC/TxRed
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness: Standard
Filter Effective Index: 1.76
Understanding `Effective Index of Refraction` neff
Substrate type: low-autofluorescence optical quality glass
Flatness / RWE Classification: Image-splitting
Reflected Wavefront Error: < 2λ P-V RWE @ 632.8 nm
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unm: ± 0.05 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate thickness: 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Other physical specs: Standard Specifications of Our Filters and Beam Splitters
Number of Bands/Edges/Notches: 1
Warranty: 10 years
Edge Steepness: Standard for fluorescence
Substrate Thickness: 1 mm
Scratch-Dig: 60-40
Type of Beamsplitter: Longpass
CWL/EdgeWL/NotchWL (nm): 580
Dimensions: 25,2 x 35,6 mm
Application (Beamsplitter): Laser application
Damage Threshold: no signs of degradation acc. to testing
Suitable for: Image-Splitting
Flatness: Not defined
Manufacturer (Optical Filters): IDEX / Semrock